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A substantial update of his earlier IEE book, Modern Electronic Test and Measuring Instruments, the author provides a state-of-the art review of modern families of digital instruments. For each family he covers internal design, use and applications, highlighting their advantages and limitations from a practical application viewpoint.The book also treats new digital instrument families such as DSOs, Arbitrary Function Generators, FFT analysers and many other common systems used by the test engineers, designers and research scientists.
- Sales Rank: #3676912 in Books
- Brand: Brand: The Institution of Engineering and Technology
- Published on: 2003-01-24
- Original language: English
- Number of items: 1
- Dimensions: 9.75" h x 6.50" w x 1.75" l, 1.10 pounds
- Binding: Hardcover
- 675 pages
- Used Book in Good Condition
Review
'the author provides a state-of-the art review of modern families of digital instruments.' --Current Engineering Practice, Vol.45, No.2-3, 2002-2003
About the Author
Nihal Kularatna is a Senior Lecturer at the Department of Electrical & Electronic Engineering at the University of Auckland, New Zealand. From 1986 to 2000 he developed a research and development base at the Arthur C. Clarke Institute for Modern Technologies in Sri Lanka where he was a Principal Research Engineer and subsequently CEO (2000-2001). He has published over 50 papers and is the author of three books. He is a Fellow of the IET.
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